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DEVELOPING THE WAVELENGTH SCANNING INTERFEROMETER (WSI) FOR NANOMEND

Within the NANOMEND project, funded by the EU FP7 program, IBS Precision Engineering and the University of Huddersfield are collaborating in the development of a new optical interferometry system for fast areal surface measurements. NanoMend aims to develop in-line defect detection systems that are capable of detecting micro and nano sized defects within the thin films that coat flexible electronics and paper food cartons.

IBS Precision Engineering is currently involved in developing a Wavelength Scanning Interferometer (WSI) that can make 3D measurements using varying wavelengths in an interferometer setup. This makes it possible to generate a 3D measurement within seconds. Micro- and nanoscale surfaces can be measured, where environmental noise is corrected by the measurement system. The WSI can be used to measure both smooth surfaces and large step heights.

Measurements using the WSI prototype, that we also demonstrated at the Euspen exhibition earlier this year, show a height measuring range of 90 µm while achieving nanometer resolution within seconds. Further development is focussed on making the WSI faster and more easily to integrate in-situ.

For more information on Nanomend, please see the video below (courtesy of Nanomend) or visit the NANOMEND program website.